UNITED
STATES
SECURITIES
AND EXCHANGE COMMISSION
Washington,
DC 20549
FORM
6-K
REPORT
OF FOREIGN PRIVATE ISSUER
PURSUANT
TO RULE 13a-16 OR 15d-16 OF
THE
SECURITIES EXCHANGE ACT OF 1934
11
January 2010
Commission
File No.: 000-30688
NOVA
MEASURING INSTRUMENTS LTD.
(Translation
of registrant’s name into English)
Building
22 Weizmann Science Park, Rehovot
P.O.B
266
Israel
(Address
of principal executive offices)
Indicate
by check mark whether the registrant files or will file annual reports under
cover Form 20-F or Form 40-F.
Form
20-F S Form
40-F £
Indicate
by check mark if the registrant is submitting the Form 6-K in paper as permitted
by Regulation S-T Rule 101(b)(1): ____
Indicate
by check mark if the registrant is submitting the Form 6-K in paper as permitted
by Regulation S-T Rule 101(b)(7): ____
Indicate
by check mark whether by furnishing the information contained in this Form, the
registrant is also thereby furnishing the information to the Commission pursuant
to Rule 12g3-2(b) under the Securities Exchange Act of 1934.
Yes £ No S
Attached hereto and incorporated by way
of reference herein is a press release issued by the Registrant and entitled
“Nova Integrated Metrology for Etch Deployed by a Major Foundry in Asia
Pacific”
This
report on Form 6-K is hereby incorporated by reference into Nova Measuring
Instruments Ltd.'s registration statements on Form S-8, filed with the
Securities and Exchange Commission on the following dates: September 13, 2000
(File No. 333-12546); March 5, 2002 (File No. 333-83734); December 24, 2002
(File No. 333-102193, as amended by Amendment No. 1, filed on January 5, 2006);
March 24, 2003 (File No. 333-103981); May 17, 2004 (three files, File Nos.
333-115554, 333-115555, and 333-115556, as amended by Amendment No. 1, filed on
January 5, 2006); March 7, 2005 (File No. 333-123158); December 29, 2005 (File
No. 333-130745); September 21, 2006 (File No. 333-137491); and November 5, 2007
(File No. 333-147140) and into Nova Measuring Instruments Ltd.'s registration
statement on Form F-3, filed with the Securities and Exchange Commission on May
11, 2007 (File No. 333-142834).
SIGNATURES
Pursuant
to the requirements of the Securities Exchange Act of 1934, the registrant has
duly caused this report to be signed on its behalf by the undersigned, thereunto
duly authorized.
|
Date:
11/01/2010
|
NOVA
MEASURING INSTRUMENTS LTD.
(Registrant)
By:
/s/ Dror
David
——————————————
Dror
David
Chief
Financial Officer
|
|
Company
Contact:
Dror
David, Chief Financial Officer
Nova
Measuring Instruments Ltd.
Tel:
972-8-938-7505
E-mail: info@nova.co.il
E-mail: http://www.nova.co.il
|
Investor
Relations Contacts:
Ehud
Helft / Kenny Green
CCG
Investor Relations Israel
Tel:
+1-646-201-9246
nova@ccgisrael.com
|
Nova Integrated Metrology for Etch
Deployed by a Major Foundry in Asia Pacific
Order brings the number of Integrated Metrology Etch
customers to four
REHOVOT, Israel, January 11, 2010
- Nova Measuring Instruments Ltd. (NASDAQ: NVMI)
provider of leading edge stand-alone metrology and the market leader of integrated
metrology solutions to the semiconductor process control market, today announced
that a major foundry in Asia Pacific has decided to deploy its NovaScan
Integrated Metrology (IM) solution coupled with NovaMARS® shape
profiling software, for 45nm gate Etch Advanced Process Control. The company
expects additional tools to be ordered and installed during 2010 from this
particular foundry.
“Foundries
continuously deal with a large variety of products, combined with an ever
increasing need to tighten process control and reduce process variability,”
commented Noam Shintel, Director of Corporate Marketing at Nova. “Our leading
Integrated Metrology platform enables fast and accurate closed-loop control of
the Etcher, resulting in higher yield and improved productivity for our
customers. Expanding our product reach into more areas of the fab through a
broadened product offering has become part of our strategy and we expect this
trend to continue into the future”.
The
NovaScan integrated metrology platform is available in conjunction with Applied
Materials, Lam Research and Ebara Corporation CMP and Etch tools. The platform
provides a state-of-the-art metrology solution, implementing polarized normal
incidence spectroscopic scatterometry with an extended UV and IR spectral range.
NovaScan Integrated Metrology, featuring the highest fleet
(tool-to-tool) matching and throughput, is an ideal and cost-effective metrology
solution for the most demanding 2D, 3D, and in-die film thickness, Optical CD
and shape profiling applications.
About Nova: Nova Measuring
Instruments Ltd. develops, produces and markets advanced integrated and stand
alone metrology solutions for the semiconductor manufacturing industry. Nova is
traded on the NASDAQ & TASE under the symbol NVMI. The Company's website is
www.nova.co.il.
This
press release contains forward-looking statements within the meaning of safe
harbor provisions of the Private Securities Litigation Reform Act of 1995
relating to future events or our future performance, such as statements
regarding trends, demand for our products, expected deliveries, transaction,
expected revenues, operating results, earnings and profitability.
Forward-looking statements involve known and unknown risks, uncertainties and
other factors that may cause our actual results, levels of activity, performance
or achievements to be materially different from any future results, levels of
activity, performance or achievements expressed or implied in those forward
looking statements. These risks and other factors include but are not limited
to: unanticipated consequences of the global economic crisis, our dependency on
a single integrated process control product line; the highly cyclical nature of
the markets we target; our inability to reduce spending during a slowdown in the
semiconductor industry; our ability to respond effectively on a timely basis to
rapid technological changes; risks associated with our dependence on a single
manufacturing facility; our ability to expand our manufacturing capacity or
marketing efforts to support our future growth; our dependency on a small number
of large customers and small number of suppliers; risks related to our
intellectual property; changes in customer demands for our products; new product
offerings from our competitors; changes in or an inability to execute our
business strategy; unanticipated manufacturing or supply problems; changes in
tax requirements; changes in customer demand for our products; risks related to
currency fluctuations; and risks related to our operations in Israel. We cannot
guarantee future results, levels of activity, performance or achievements. The
matters discussed in this press release also involve risks and uncertainties
summarized under the heading “Risk Factors” in Nova’s Annual Report on Form 20-F
for the year ended December 31, 2008 filed with the Securities and Exchange
Commission on March 30, 2009. These factors are updated from time to time
through the filing of reports and registration statements with the Securities
and Exchange Commission. Nova Measuring Instruments Ltd. does not assume any
obligation to update the forward-looking information contained in this press
release.